Schlumberger Introduces Technology-Leading RDRAM Device Algorithmic Pattern Generator; rPacket Generator is Proven to Speed Time-to-Volume without Compromising Test
SAN JOSE, Calif., Jun 16, 1999 (BUSINESS WIRE via COMTEX) -- SchlumbergerAutomated Test Equipment (ATE) has developed a unique Algorithmic Pattern Generator (APG) designed to improve the time-to-volume of RDRAM(R) devices.
Called rPacket Generator(TM) (rPG), it is the only pattern generation solution specifically created for Rambus(R) that allows test engineers to write patterns in the native language of the Direct RDRAM packet protocol.
The Schlumberger rPG, which provides pattern generation for the company's new RDX2200(TM) system, translates the normal APG memory core patterns for Rambus devices using standard APG programming concepts similar to writing traditional memory patterns. Easy to use, rPG has a minimal learning curve and makes it easy to handle interpretive changes.
"This technology is another example of outstanding innovation from Schlumberger," stated Jackie Tubis, president, Schlumberger ATE. "rPG provides single pass, at-speed test to deliver speed and quality simultaneously. Our customers assisted in development and prototype testing of rPG and are reporting extremely short turnaround times with superior performance."
Competitive systems require significantly more complex patterns with very long source language files that are potentially difficult to debug. With rPG, a small amount of code is all that is required to generate patterns, which can be done in minutes instead of hours or days.
The Schlumberger rPG allows full at-speed testing of the RDRAM memory core and I/O interface at up to 1 gigabit per second. Combined with deep vector memory of 128 Mbit per pin for testing a high speed I/O, the RDX2200 system is the most powerful single-pass test production system on the market today.
The rPG also provides full featured support for RDRAM device and RIMM(TM) module test and characterization. Using the RDX2200 system's fail capture memory, the rPG provides full-featured bitmap and failure analysis capabilities including recording which device on a RIMM has generated each failure. This feature set is key for critical design debug, design validation and yield enhancement for high volume production.
First out of the gate with the industry's only high performance RDRAM device test solution, Schlumberger is helping its customers stay ahead of the productivity curve in the evolving ramp of this challenging new technology. Designed to significantly accelerate RDRAM device manufacturers' time-to-volume and dramatically increase yields, the new Schlumberger RDX series is flexible enough to accommodate evolving test methodologies, and is identical in tester operation, from design validation through production testing, greatly simplifying and shortening the RDRAM device development cycle. Additionally, SABER(sm) (Schlumberger Advanced Business Engineering Resources) provides skilled business and engineering resources to assist memory manufacturer's transition to this dramatically new technology.
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