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Politics : Formerly About Advanced Micro Devices
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To: kapkan4u who wrote (62381)6/19/1999 12:42:00 AM
From: kash johal  Read Replies (3) of 1572939
 
kap,

Re:" comment on Paul's possible slip of the tong that CuMine is testing fine at 600 MHz at room temperature, but degrades with higher temperatures. Could this mean a process problem?"

I can see several scenarios:

1. The designers didn't model the routing paths properly.
This could require chip relayout and rerouting.

2. Xtalk Noise due to coupling - which degrades as temp increases and also voltage increases (might explain why "jacking up the voltage" was not option"

3. He's just saying parts work fine at RT. You still need to guardband for temp and voltage so you need 20% margins.

I am sure there are many more.

I doubt the problem is "process" related as I am sure they understand their transistors very well and ran SRAM test chips etc.

The solution may be to brute force the process another 10-15% as their isn't time to completely redo the design coupled with limited metal fixes.

Still november looks like a tough deal, but I imagine the best and brightest will be working on this one.

Regards,

KAsh
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