Aehr forms test fixtures unit for known-good die, advanced
IC burn-in/testing
Semiconductor Business News
(09/20/99, 12:17:04 PM EDT)
MOUNTAIN VIEW, Calif.--Aehr Test Systems here today announced the formation
of a new test fixtures business unit to serve burn-in and testing systems for
advanced memories and logic ICs, including unpackaged chip products.
The new Aehr Test Fixtures unit will focus on enhancing the company's ability to
serve customers with specialized burn-in and test requirements not currently
available in existing equipment, said the company. The new unit will handle Aehr's
DiePak carriers for known good die testing, which enable chip companies to sell ICs
as bare die products. Aehr Test Fixtures will also be responsible for the company's
MTX massively parallel testers, burn-in boards as well as the MAX and ATX Dynamic
Burn-in systems.
"The new group is designed to offer the responsiveness required to meet the quick
turnaround requirements of the fixturing business," said Rhea Posedel, president and
CEO of Aehr Test. "We expect this group will help advance sales and improve service
in this important segment of our business."
Heading the new business unit is Rick Pendergrass. "We are particularly excited
about the increased level of interest in the DiePak known good die product,"
Pendergrass said. "We believe we are seeing the effects of growing mission-critical
requirements among components users inthe aerospace, military, automotive, and
medical equipment fields. Current quote and order activity is showing an upward trend
in these areas."
While unpackaged semiconductors have been sold into many low-cost consumer product
applications, the use of bare die products has been limited in commercial systems
because of the difficulty in guaranteeing reliability and the costs of testing (see
feature story from SBN Online Magazine). However, new carriers and wafer-level
burn-in/testing concepts could help to lower the cost of known-good die, according to
KGD proponents. |
