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Politics : Formerly About Advanced Micro Devices
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To: Zoran who wrote (80052)11/17/1999 1:11:00 AM
From: Process Boy  Read Replies (1) of 1579783
 
Zoran - <My results show that major device/circuit parameter distributions are worse in the case of notched gate by 20-60% compared to classical gates. The one parameter that was heavily affected was the overlap capacitance.PB, it doesn't matter whose chip it was. The problem is independent of manufacturer. I know you are familiar with the problem and you had to sit through numerous meetings discussing this issue.>

I'm going to wait for the IEDM presentation. Maybe we'll have some fodder to continue this then.

Without giving credence to your manufacturability argument, I will acknowledge that if the notch dimension is not adequately controlled, Cov (Capacitance - overlay) would obviously be an issue.

PB
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