Formerly About Advanced Micro Devices Message Board

STOCKTALK

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor. We ask that you disable ad blocking while on Silicon Investor in the best interests of our community. If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.

Politics : Formerly About Advanced Micro Devices

Public Reply Prvt Reply Mark as Last Read File

Previous 10 Next 10 Previous Next

To: Bill Jackson who wrote (81613)	12/1/1999 11:23:00 AM
From: Elmer	Read Replies (1) of 1572776

Re: "I wonder if this bug is a threshold bug that slipped out because they loosened a test spec to ship more parts? " Bill, the term "bug" is misapplied here. This is a test escape, not a bug. A bug is a flaw in the logic that affects all parts, like the fdiv bug. This looks like a process sensitivity that only affects a small number of parts at powerup. It can be screened for at test and corrected in a future stepping to avoid yield loss. Customers(oems) know in the early life of a new product the DPM (defects per million) will be higher than at maturity. A bug affects all parts, a test escape affects only a small number of parts. EP

Report TOU Violation

Share This Post

Public Reply Prvt Reply Mark as Last Read File

Previous 10 Next 10 Previous Next