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Politics : Formerly About Advanced Micro Devices

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To: Mani1 who wrote (82273)12/7/1999 9:56:00 PM
From: Bill Jackson  Read Replies (2) of 1576397
 
Mani, You could probably use Ohm's law. After all with more than 20 million transistors they will not all go on at the same time and then off with the clock so you will get an avaeraged effect and I bet if you hooked up a gigahertz scope to the part you would not see anything more than a little grass that represents the power supply surges of those nanosecond transitions that are all averaged out. Since it all ends up as ohmic heating I think you would be within 1% of the truth. The calorimetric method you suggest would be less accurate and would take more time and would be used for heat sink designs to see what it steady states at for different speeds and voltages. A series of experiments in a test jug with a special on chip thermal probe would probably be used for this. After a while they will get enough data to program the CPU test jigs to know how to bin the various parts for sale. That means they may have some 1.5gig parts that will melt in 90 seconds but are fine 650 meg parts in that use. They will also get a few that melt right away and they go into fault analysis and so on. Every part will have it's bin and there will be parts in every bin.....but which bins??
Elmer used to work for a Norwegian Fishing Company and their specialty was herrings, the red kind, he drags a few across our bow every day, but the smell always seems to stick to him.

Bill
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