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Politics : Formerly About Advanced Micro Devices

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To: pgerassi who wrote (115412)	6/11/2000 2:00:00 AM
From: Elmer	Read Replies (3) of 1577700

Re: "I still think that a manufacturing plant yields a probability curve. The usuable bin splits are a yield not a bin split" This wins the award for the most incomprehensible line ever posted on SI. Yield is the ratio of good die over total die at sort where speed grading is not reliably possible. It is an indicator of defect density and does not relate to speed, unless the manufacturer decides to reject die based on parameters measureable at wafer sort which correlate to final test speed grading, a close approximation at best but cost effective nonetheless if low speed parts have no market value. Re: "When Athlon is optimised by assembly, Cmine loses big time. The days of SPEC victories are numbered for Cmine." Easy to say when you don't have any links to reference. The links that do exist show exactly the opposite. CuMine destroys Athlon in both SPECint and SPECfp. I'll do what you are unwilling or too embarrassed to do. I'll post links that backup my claims: specbench.org specbench.org spec.org spec.org Where is your proof? Why is AMD too ashamed to post SPEC scores for TTurd? A 7.5 generation processor???? I don't think so.... EP

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