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MSD.TO
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Wednesday July 12, 9:08 am Eastern Time
Company Press Release
MOSAID Launches Memory Module ATE Products
OTTAWA--(BUSINESS WIRE)--July 12, 2000--The Systems Division of MOSAID Technologies Inc. (TSE:MSD. - news) today announced the Acuid family of memory module test solutions at SEMICON West 2000.
The Acuid family of robust and flexible memory module test products provides the advanced test solutions needed to test SDRAM, DDR-SDRAM SIMMs and DIMMs. The Acuid tester is housed in a compact bench-top cabinet or integrated into a memory module handler.
``During several bench mark trials, the Acuid tester performed impressively, achieving excellent correlation of test results with mainframe test systems,'' said Glenn Evans, General Manager of MOSAID Systems Division. ``With continued advances in memory technology and the cost competitive nature of memory suppliers, memory module manufacturers require cost-effective test that still insures the delivery of high quality module products. I believe the Acuid line offers that solution.''
The Acuid tester consists of a PC controller, a base unit and a series of test headers. The base unit provides all pattern generation, bitmap capture, and timing functions. Each test header provides the pin electronics for a particular type of memory module, such as SDRAM, DDR SDRAM, etc.
The Acuid Module Handler uses a tray conveyer system to route the trays of modules under test into a temperature soak chamber and then on to the test chamber. A simple and reliable set of robotic arms insert the modules one at a time into the test socket and, after testing, return each module to the tray. The tray is then moved to a cool-down area and finally returned to the load area for computer assisted binning by the operator. The module-to-module index time is less than one second and modules can be sorted into 256 bins.
Product demonstrations are available during exhibition hours of SEMICON West 2000 at Booth #9606. |
