Rudolph Technologies Receives 70Th Order for Copper MetaPULSE Tool
Major Taiwanese Customer Places Second Copper Tool Order in Less Than 60 Days
FLANDERS, N.J.--(BUSINESS WIRE)--Aug. 15, 2001-- Rudolph Technologies, Inc. (Nasdaq: RTEC - news), a worldwide leader in the design, development, manufacture and support of high-performance process control metrology systems used by semiconductor device companies, today announced that it has received its 70th order for its copper MetaPULSE technology. The order was placed by one of Taiwan's leading foundry companies, and represents the second copper tool order in less than 60 days by this customer.
``As a result of our ability to develop and deliver leading edge products, we believe nearly all of the device manufacturers developing copper processes are making Rudolph's MetaPULSE interconnect metrology tools a part of their chip-development roadmap,'' commented Paul F. McLaughlin, Chairman and CEO. ``Given our market leading position with our new copper and 300 millimeter measurement tools, we believe we will be one of the first companies out of the industry's current downturn.''
In less than two years since its introduction, twenty-two customers have purchased the Company's copper MetaPULSE technology, with an average sales price between $1.2 million and $1.6 million per tool. Nine of the twenty-two customers have placed multiple tool orders. Overall more than thirty customers have purchased MetaPULSE tools in order to meet aluminum and copper metrology needs for leading edge devices. Rudolph announced the purchase of the 100th MetaPULSE tool last November.
Rudolph's MetaPULSE family of copper tools can simultaneously measure six or more metal film layers on 200 mm and 300 mm product wafers. This exclusive technology uses a non-contact, non-destructive measurement technique based on laser-induced ultrasound. This enables semiconductor manufacturers to improve their yields and control the process challenges of copper metallization.
About Rudolph Technologies
Rudolph is a worldwide leader in the design, development, manufacture and support of high-performance process control metrology systems used by semiconductor device manufacturers. The Company provides a full-fab solution through its families of proprietary systems for both transparent and opaque thin film measurement. Rudolph's product development has successfully anticipated and addressed many emerging trends that are driving the semiconductor industry's growth. The Company's success in creating complementary metrology applications through aggressive research and development is key to Rudolph's strategy for continued technological and market leadership.
This press release contains forward-looking statements. Actual results may differ materially from those projected due to a number of risks, including changes in customer demands for our existing and new products, the timing, cancellation or delay of customer orders and shipments and the timing of revenue recognition of shipments, new product offerings from our competitors, changes in or an inability to execute Rudolph Technologies' business strategy, unanticipated manufacturing or supply problems, and changes in tax rules. Rudolph Technologies cannot guarantee future results, levels of activity, performance or achievements. The matters discussed in this press release also involve risks and uncertainties summarized under the heading ``Risk Factors'' in Rudolph Technologies' Form 10K filed for the year ended December 31, 2000. These factors are updated from time to time through the filing of reports and registration statements with the Securities and Exchange Commission. Rudolph Technologies does not assume any obligation to update the forward-looking information contained in this press release. |
