United States Patent 6,330,064
Rieder December 11, 2001
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Doubly-differential interferometer and method for evanescent wave surface detection
Abstract
A high speed, highly sensitive optical sensing platform and a method for detecting and/or measuring characteristics of a substance in a measurement sample are disclosed. The platform includes at least one pair of optical paths formed in a waveguide, a light source for injecting optical beams along the optical paths, a light modulator for enabling the excitement of a transverse electric and a transverse magnetic guide modes, and a phase detector for detecting phase differences between the beams propagating along the optical paths. One of the optical paths has a target analyte of unknown concentration with a measurement sample bound to its upper surface, while the second optical path has a reference sample containing a known concentration of the target analyte bound to its upper surface. A guided mode modulator causes an optical beam to propagate through the waveguide sequentially as two polarized modes. The highly sensitive platform is especially useful for directly detecting and/or measuring very small numbers of small molecules, bio-molecules, microorganisms in a liquid or gaseous test sample.
BTW, what happened to Cabrina, et al. on this thread? |
