SI
SI
discoversearch

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor.  We ask that you disable ad blocking while on Silicon Investor in the best interests of our community.  If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.
Technology Stocks : Advanced Micro Devices - Moderated (AMD)
AMD 216.00-0.7%Dec 4 3:59 PM EST

 Public ReplyPrvt ReplyMark as Last ReadFilePrevious 10Next 10PreviousNext  
To: Yousef who wrote (75566)3/26/2002 12:38:51 AM
From: hmalyRead Replies (1) of 275872
 
Yousef Re...Yield = [[1 - e^-AD]/AD]^2 ... A = chip area in cm^2 ... D = defect density in defects/cm^2<<<<<

Thanks for the post. I have a couple of questions. From previous discussions, I had assumed "defect density" meant the number of defects expected in a area of silicon before processing, which would of itself destroy a chip. Your formula for BE also includes a multiplier of n for the number of layers, but the MUR formula doesn't. Why? What determines defect density. The no. of bad chips, or the defects one can expect in silicon? If the defect density is compiled by totaling bad die/cm^2, are all processing errors called defect densities.
Report TOU ViolationShare This Post
 Public ReplyPrvt ReplyMark as Last ReadFilePrevious 10Next 10PreviousNext