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Technology Stocks : Advanced Micro Devices - Moderated (AMD)
AMD 218.97+1.4%12:53 PM EST
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To: Elmer who wrote (75603)3/26/2002 11:21:05 AM
From: hmalyRead Replies (2) of 275872
 
Elmer Re.... I would add that the defect density number is measured at wafer sort and is primarily based on particulates. <<<<<<<

When is wafer sort done. From a laymans point of view, I would expect that wafer sort is done after slicing and polishing of the wafer, but before any imaging steps, to eliminate any wafers with a bad polish and too high of a particulate density.
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