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Technology Stocks : Advanced Micro Devices - Moderated (AMD)
AMD 216.00-0.7%3:59 PM EST
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To: hmaly who wrote (75609)3/26/2002 3:33:06 PM
From: YousefRead Replies (1) of 275872
 
Hmaly,

Re: "From your description it would seem DD encompasses any type of killer defect ..."

This is true the way I have described yield (Ysimple). It is very
simplified to just think of defect density as due to particles.
I have seen many design rule/process margin problems that clearly
affect Ysimple and thus the calculated defect density. A good example
would be high Via resistance caused by Vias falling too far off the
metal interconnect. This high Via resistance can cause speed critical paths
to fail and this could be worse at the edge of the wafer relative to
the center. This is but just one example of how design rules interact with
the process and can cause yield loss.

I am not saying that AMD has a specific (high Via resistance) yield
problem. Hard defects and process margins need to be continually improved
to achieve "world class" defect density. Hope this helps.

Make It So,
Yousef
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