Aehr Test Systems Receives Order for Fox Full Wafer Test & Burn-In System
Tuesday September 23, 7:01 am ET
FREMONT, Calif., Sept. 23 /PRNewswire-FirstCall/ -- Aehr Test Systems (Nasdaq: AEHR - News), a leading supplier of semiconductor test and burn-in equipment, today announced that Fuji Xerox Co., Ltd. has placed an order for a FOX(TM) full wafer contact test and burn-in system. The system is expected to ship in early calendar 2004.
"We are very pleased to receive another order for our FOX system," said C.J. Meurell, president and chief operating officer of Aehr Test. "We believe this is a good sign that our FOX family of full wafer contact test and burn-in products is beginning to be accepted around the world."
"Aehr Test's FOX systems include our WaferPak(TM) cartridge, which utilizes advanced interconnect technologies for contacting wafers," said Carl Buck, vice president and general manager of Aehr Test's contactor business unit. "The modular nature of our WaferPak design allows us to match the best wafer contactor and signal distribution technologies for each customer's application."
"We wanted a system that would allow us to burn-in our VCSELs at wafer-level," said Takeshi Nakamura, VCSEL project leader for Fuji Xerox. "There is a significant cost advantage to stabilizing the VCSEL electrical characteristics prior to packaging."
VCSELs (Vertical Cavity Surface Emitting Lasers) are used in high-speed local-area data communications and represent the latest technology in semiconductor laser diodes. VCSELs are different from previous laser diodes in that, with the appropriate equipment, the light emitted from VCSELs can be tested while still in wafer form. Previous technologies required additional packaging steps, before the laser diodes could be fully tested. FOX allows test and burn-in at the wafer level, thereby saving the cost of the packaging if the laser fails.
About Fuji Xerox
Fuji Xerox Co., Ltd. was established on February 20, 1962 as a joint venture between Fuji Photo Film Co., Ltd. and Rank Xerox Limited of the United Kingdom (company name changed to Xerox Limited on October 31, 1997). The present capital investment ratio is 75% Fuji Photo Film Co, Ltd. and 25% Xerox Limited.
About Aehr Test Systems
Headquartered in Fremont, California, Aehr Test Systems is a leading worldwide provider of systems for burning-in and testing DRAM and logic integrated circuits and has an installed base of more than 2,000 systems worldwide. Aehr Test has developed and introduced several innovative products, including the FOX, MTX, MAX3 and MAX4 systems, and the DiePak® carrier. The FOX system is a full wafer contact test and burn-in system. The MTX system is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com.
Safe Harbor Statement
This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand for Aehr Test's products and expectations of future sales and performance of the FOX system. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the FOX and WaferPak technologies, market acceptance of new products, ability of new products to meet customer needs or perform as described, strong competition in our markets, the risks associated with bringing new products to market and the potential emergence of alternative technologies, which could adversely affect demand for Aehr Test's products in fiscal year 2004. See Aehr Test's recent 10-K report filed with the SEC for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.
For further information, please contact Steve Steps, Senior Director of Wafer-Level Burn-In and Test of Aehr Test Systems, +1-510-623-9400; or Analysts, Jocelyn Hunter, +1-415-248-3433, or General Inquiries, Linda Chien, +1-310-407-6547, both of FRB | Weber Shandwick, for Aehr Test Systems.
Source: Aehr Test Systems |
