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Technology Stocks : Intel Corporation (INTC)
INTC 48.73+3.0%3:59 PM EST

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To: robert b furman who wrote (178600)7/13/2004 10:27:41 PM
From: Elmer Phud  Read Replies (1) of 186894
 
Bob

It is a generic term that means a defect or failure mode was missed that could have been screened at test. Sometimes it requires a new technique, sometimes it was just something that was missed. In this case the details were never made public so all discussion is speculative. I based my speculation on the general description of the problem plus the quick turnaround with a fix. If it's what I think it is, glass left on the pads, it should have never happened in the first place, it should have been caught at one of the monitoring steps, it should have been caught at wafer sort and it should have been caught at final test. This is just speculation though on my part.
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