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From: NightOwl	3/1/2006 5:20:50 PM
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Scanning Probe Microscopy Veeco Instruments has introduced two new application modules for its Digital Instruments CP-II scanning probe microscope. The scanning capacitance microscopy (SCM) and conductive atomic-force microscope (CAFM) add-on modules enable advanced electrical characterization. The SCM unit can measure variations in carrier concentration on silicon and compound semiconductor structures. It also makes possible electrostatic force microscopy and surface potential imaging. The CAFM module can analyze variations in film thickness, locate electrical defects, and map the electrical properties of materials. It can measure local current-voltage or current-force spectra and provide polarization measurements of small ferroelectric capacitors and single grains. Veeco Instruments Inc, 100 Sunnyside Boulevard, Suite B, Woodbury, NY 11797-2902, veeco.com 0\|0

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