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Technology Stocks : Advanced Micro Devices - Moderated (AMD)
AMD 215.11+0.1%Dec 24 12:59 PM EST
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To: kpf who wrote (220040)12/11/2006 5:41:08 PM
From: Elmer PhudRead Replies (1) of 275872
 
kpf

I think some posters here are blowing this way out of proportion. There are techniques to address intra die variation and they can easily be implemented at sort. Speed grading can be done at sort by at least 4 methods and die can be tuned and binned at sort as well. Where he gets the notions he has is beyond me. I've heard Ali make his arguments before but he is very easily befuddled.

DFM methods are primarily transition fault testing but there are others.
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