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Technology Stocks : Advanced Micro Devices - Moderated (AMD)
AMD 214.990.0%Dec 26 9:30 AM EST
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To: Sarmad Y. Hermiz who wrote (237255)7/26/2007 1:54:09 PM
From: dougSF30Read Replies (1) of 275872
 
Yes, for raw yields... probably significantly lower for all 4 cores working at reasonable speed/power.

http://siliconinvestor.com/readmsg.aspx?msgid=23735550

From: ephud 7/26/2007 1:50:13 PM
of 1723

AMD and Defect Density

Defect Density is a measurement meant to both describe the yield on a process and predict yield when no data is available other than die size. By statistically analyzing yield on a volume product you can predict what a new product will yield based on the probability of a defect happening within the area of the die. In the past this number was dominated by particle defects and may still be for the best processes, but softer more subtle defects (faults) now play a significant role. The soft faults require more sophisticated testing because they show up typically as excessive delays in speed paths, so they require high frequency testing which exercises a high percentage of the possible speed path permutations. Typical DD numbers are based on wafer sort yields and may not include the types of tests needed to uncover the soft errors that are becoming more common in the finer processes. We just don't know. Then there's the leakage question. Leakage is not linear and subthreshold leakage is worst case hot. Wafer sort is not usually done at hot temps so that DD number may no reflect excessive leakage parts, again we just don't know. WBMW did a fine job of analyzing AMD's datasheet and showed tht AMD has a wide range of leakage speced parts which suggests it is a challenge to control.

Whatever the unknowns are, even under the best conditions, 0.5cm2 is not close to a world class number and I'm still shocked they let that number out.
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