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To: NightOwl who wrote (13567)	9/27/2007 10:37:19 AM
From: NightOwl	Read Replies (1) of 14464

TI's contactless smart platform for the next generation of government ID will employ an advanced embedded memory technology, called FRAM (Ferroelectric Random Access Memory), which considerably improves the speed and reliability of future smart, secure e-passports and government ID documents. TI's embedded FRAM memory advancement is based upon a joint technology development and licensing agreement with Ramtron International Corporation, a leading supplier of nonvolatile FRAM, formed in 2001. The technology will provide a significant improvement over the non-volatile memory technologies used in current electronic government ID, such as Electrically Erasable Programmable Read-Only Memory (EEPROM) and Flash, offering major advantages in terms of transaction speed, power consumption and enhanced write data reliability. TI's solution helps the government ID customer meet the rigorous demands of the environment in which government ID documents operate. TI has written a white paper titled, "The Advantages of FRAM-Based Smart ICs for Next-Generation Government Electronic IDs." To download, please click on ti.com; prnewswire.com

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