SI
SI
discoversearch

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor.  We ask that you disable ad blocking while on Silicon Investor in the best interests of our community.  If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.
Politics : Formerly About Advanced Micro Devices
 Public ReplyPrvt ReplyMark as Last ReadFilePrevious 10Next 10PreviousNext  
To: Petz who wrote (26457)12/5/1997 1:03:00 AM
From: Yousef  Read Replies (1) of 1573993
 
John,

Re: "There is no difference
in reliability, only a small cost for the fan."

This is not true John ... the reduction in chip life comes from the increased
electric field across both the gate oxide and from source to drain on the
FET. Heat can also accelerate failures but voltage (E-field) acceleration
happens much, much more quickly.

Make It So,
Yousef
Report TOU ViolationShare This Post
 Public ReplyPrvt ReplyMark as Last ReadFilePrevious 10Next 10PreviousNext  

HomeMailHotSubjectMarksPeopleMarksKeepersSettings
Terms Of UseContact UsCopyright/IP PolicyPrivacy PolicyAbout UsFAQAdvertise on SI
© 2025 Knight Sac Media.  Data provided by Twelve Data, Alpha Vantage, and CityFALCON News