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Politics : Formerly About Advanced Micro Devices
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To: Paul Engel who wrote (28076)1/23/1998 9:46:00 AM
From: Bill Jackson  Read Replies (1) of 1574854
 
Paul, I can see some bottlenecks occurring because you are only doubling the speeds, but the number of transistors could be ten times as many.
However if each section self tests rapidly, they can bother to fully test only those in the 'pass all subtest' bin(unless they have some redundant on chip sections to activate with fuse links/wires etc.

I read elsewhere that it is a problem, but solvable.

Bill
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