SI
SI
discoversearch

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor.  We ask that you disable ad blocking while on Silicon Investor in the best interests of our community.  If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.
Politics : Formerly About Advanced Micro Devices

 Public ReplyPrvt ReplyMark as Last ReadFilePrevious 10Next 10PreviousNext  
To: Maxwell who wrote (35130)7/26/1998 11:20:00 PM
From: Yousef  Read Replies (2) of 1572529
 
Maxwell,

Re: "Do you know why I like to reply your posts so much? The reason is that
you are supposed to know more process technology than me."

AND I do know more than you, Maxwell ... I see you have another "take home"
test from Bert's SOF. I want to see you get good grades, so I will help
you once again.

Re: "1) Copper process reduces backend process by 40%."

This is wrong, Maxwell ... Let me go through the process step comparisons.
I will start at dielectric deposition for each process:

Standard Al Process .................... Copper Damascene Process

1)Dep Dielectric HDP Oxide ............. 1)Dep Dielectic (SiO2/Si3N4/SiO2)
2)Polish Dielectric ............................2)Contact Lithography
3)Contact Lithography ......................3)Etch Contacts & Strip Resist
4)Etch Contacts & Strip Resist ..........4)Trench (Cu) Mask
5)Dep Seed Layer IMP Ti/TiN ...........5)Etch Trench (Oxide) & Strip Resist
6)Dep Tungsten ...............................6)Dep Seed Layer IMP Ta or TiN
7)Polish Tungsten ............................7)Dep/Electroplate Copper
8)Dep Aluminum (Ti/AlCu/TiN)..........8)Polish Copper
9)Aluminum Lithography
10) Aluminum Etch & Resist Strip

So you can see, Maxwell ... 20% fewer steps.

Re: "2) Copper conductivity is about 50% better than Al ...
...Ohm Law:...Power=R*I*I
...Lower power means lower power dissipation"

Well Maxwell, at least you got Ohm's Law correct ... I can't believe that you
think that Aluminum interconnect plays a large role in chip power dissipation.
People on this thread will "laugh" at you ... the FET's are what dissipate
power on the chip NOT metal interconnect. Even Bert will give you an
"F" on that one.

Re: "3) Low K is a breeze to integrate to copper to lower capacitance.
...Fluorinated HDP (K~2.5-3) is cakewalk with Cu damascene."

This statement is NOT true ... Fluorinated HDP will not give K values
below 3. To achieve this, you need Spin-On-Glass (SOG) will more exotic
materials that are difficult to integrate with Copper Damascene. Did you
notice that Silicon Nitride layer in the Cu flow used as an etch stop in
the dielectric "sandwich" ?? ... this silicon nitride is needed to maintain
control of the trench (Cu) thickness. Please see my last post to you
for clarification:

Message 5232529

This silicon nitride layer considerably raises the "effective K" for the
Copper Damascene dielectric ... in fact you need Low K just to get back to
the Aluminum case.

Re: "AMD will ENJOY YEARS of LOW COST MANUFACTURING CPUs while Intel engineers battle it out when to attack the COPPER MONSTER."

Just more Copper HYPE, Maxwell ... You must have a "Phd" in that field. <ggg>

Make It So,
Yousef

Report TOU ViolationShare This Post
 Public ReplyPrvt ReplyMark as Last ReadFilePrevious 10Next 10PreviousNext