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Politics : Formerly About Applied Materials
AMAT 268.72+1.3%Dec 3 3:59 PM EST

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To: BelowTheCrowd who wrote (25084)10/9/1998 12:52:00 PM
From: Jeff Fox  Read Replies (1) of 70976
 
Michael, re:AMD K-2 "yield" flaw

many of the process problems manifest themselves in the form of intermittent failures

This kind of problem is more likely to be a device design flaw rather than anything to do with the process. A common fault is to have a storage bit that gets set and reset at the same moment. The bit gets confused and goes to a one or a zero randomly. The bit works right more often than not when it escapes through the initial checkout procedure. Darn hard to find these at the silicon stage.

Jeff
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