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To: Tom Warren who wrote (24675)	7/14/1999 8:58:00 AM
From: unclewest	Respond to of 93625

news quoteserver.dogpile.com : 07/14 07:00 EST TERADYNE ARIES HIGH-SPEED MEMORY TEST SYSTEM READY FOR DIRECT RAMBUS DEVICE AND RIMM MODULE TEST SAN JOSE, Calif., Jul 14, 1999 /PRNewswire via COMTEX/ -- At Semicon West this week, Teradyne (NYSE: TER) demonstrated at-speed RIMM module testing using the ARIES High-Speed Memory Test System. The demonstration, which was performed on RIMM devices from a number of different manufacturers, focused on at-speed-testing of the memory array through the logic interface. The devices were tested at their full functional speed of 800MT/s. Teradyne also demonstrated its 16 in-parallel signal interface and handler docking solution for Direct Rambus production test. "Benchmarks have shown ARIES provides the shortest test time for Direct Rambus production test,due to ARIES broadcast HW and parallel test executive SW," remarked GlennFarris, ARIES Product Manager. "Combined with production-ready 16 in-parallel test capability today, ARIES delivers the highest throughput and lowest test cost for Direct Rambus production test." The 16 in-parallel test system will begin shipping in late July. ARIES' FlexSystem Architecture enables the complete testing of each device on a RIMM module at speeds up to 1 GT/s. ARIES hardware Algorithmic Memory pattern generator, with Rambus Pattern Protocol software, tests each memory array with topologically correct data. Moreover, the system's fail capture and compression HW and bitmapping SW enables identification of failing cells in less than one second.

To: Tom Warren who wrote (24675)	7/14/1999 9:03:00 AM
From: unclewest	Respond to of 93625

more news 07/14 07:00 EST TERADYNE UNVEILS NEW INTEGRATED GRAPHICS TEST CAPABILITY FOR J973 HIGH-PERFORMANCE VLSI TEST SYSTEM SAN JOSE, Calif., Jul 14, 1999 /PRNewswire via COMTEX/ -- At SEMICON West today, Teradyne (NYSE: TER) is announcing the immediate availability of an integrated VHF Digitizer Option for the J973 VLSI High-Performance Test System. The J973 VHF Digitizer Option (VDO) provides the necessary capabilities for full characterization and single pass production testing of integrated graphics and core logic devices. The VDO's capabilities are highlighted by testing the MPACT high performance integrated process or device from ST Microelectronics. The demonstration focuses on the RAMDAC outputs of the device and includes tests of linearity, signal to noise ratio, rise time, glitch energy, crosstalk, and settling time. According to Gordon Borneman, Mixed-Signal Product Manager for Teradyne, "Today's integrated graphics and logic devices require the speed and accuracy of a high-performance VLSI test system in order to test their high-speed bus interfaces like AGP4x, Rambus, and DDR SDRAM. They also require integrated instrumentation to test embedded graphics and video (DACs). The J973 with VHF Digitizer Option is ideally suited to the task." The VHF Digitizer Option is based on Teradyne's proven Catalyst and A500 series VHF Digitizer instruments. The VDO delivers the performance and throughput required for both characterization and production test. With the addition of the VDO option to the J973's high performance digital, advanced memory and broad scan capabilities, the J973 provides the range of test capabilities to test high-performance VLSI devices. To further demonstrate the high-speed test capabilities of the J973, Teradyne is also demonstrating the gTRAC Rambus ASIC cell at 800 MT/s. "The J973 provides the capabilities to test all of the high performance device types on a single platform," said Borneman. "With the advent of the integrated processor, the market demands one test platform for single- insertion test with complete fault coverage for all cells of the device including the CPU, the high-speed bus interfaces, the embedded DRAM, and the graphics cells. That's why the J973 is the industry's leading high- performance VLSI test system. With over 125 J973s installed world-wide, the J973 is the proven solution of choice."