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Technology Stocks : Rambus (RMBS) - Eagle or Penguin -- Ignore unavailable to you. Want to Upgrade?

To: Dave B who wrote (24690)	7/14/1999 1:57:00 PM
From: MulhollandDrive	Read Replies (1) \| Respond to of 93625

Oh that's just peachy. The company has totally downplayed "earnings" this quarter with the "flat earnings" guidance. I can just hear CNBS spinning that one now. bp

To: Dave B who wrote (24690)	7/14/1999 1:58:00 PM
From: unclewest	Respond to of 93625

news..clip.. another company enters the game unclewest 07/14 11:11 EST AETRIUM DEMONSTRATES DYNAMIC TEMPERATURE CONTROL SYSTEM FOR TEST HANDLER APPLICATIONS AT SEMICON WEST ST. PAUL, Minn., Jul 14, 1999 /PRNewswire via COMTEX/ -- Aetrium Incorporated (Nasdaq: ATRM) today announced that it is demonstrating the industry's first dynamic temperature control system for integrated circuit (IC) test handler applications, the Aetrium Model DTX Engineering System, at SEMICON West '99. The Aetrium Model DTX Engineering System that is being shown is the forerunner of a full line of dynamic temperature control IC test handlers, the Aetrium Model DTX Series, that Aetrium continues to develop forhigh-volume production IC test handling applications. Aetrium plans to introduce ModelDTX Series IC test handlers over the next year. Unlike conventional test handler designs, which use a chamber to thermally condition integrated circuits (ICs) before and during testing, the Aetrium DTX uses Aetrium's proprietary conductive thermal technology to monitor and control the temperature of the ICs under test. This revolutionary new design will allow the customer to test ICs, such as Direct Rambus (DRAM) ICs, across a full range of temperature requirements in one pass, without having to take the IC out of the test socket. It is ideally suited for new forms of memory ICs, such as Direct Rambus (DRAM), as well as high-power logic IC testing applications. In both Direct Rambus (DRAM) and high-power logic applications, the DTX will meet the challenge of managing the heat generated by the device itself while maintaining precise test temperatures.

To: Dave B who wrote (24690)	7/14/1999 2:01:00 PM
From: unclewest	Read Replies (1) \| Respond to of 93625

rambus products must be in every booth at the semicon conference. unclewest 07/14 11:30 EST ADVANTEST INTRODUCES HIGH-VOLUME PRODUCTION TEST SYSTEM, EXPANDS ADVANCED GENERATION T6600 VLSI TEST FAMILY ... TRUE FAMILY Compatibility Means No Adjustment To Hardware Fixturing, No Test Program Rewrites SAN JOSE, Calif., Jul 14, 1999 /PRNewswire via COMTEX/ -- Semicon Booth No.: 10442 -- Advantest, the semiconductor industry's leader in ATE performance, is introducing the T6672 VLSI Test System for high-volume production testing at Semicon '99. The T6672 is a lower cost, highly compatible production test companion to the T6682, a high-performance characterization system. Designed with Advantest's advanced, proprietary architecture, both systems are aimed at ASIC or System-On-a-Chip (SOC) devices that require test of embedded memory, large SCAN patterns, or mixed-signal features. The two systems' high degree of compatibility is unique in the industry. Customers save time, money and effort by using the T6682 and the T6672 for characterization and production because hardware fixturing and test programs are truly interchangeable between the systems. The T6672 can be used to provide wafer probe of RAMBUS, Fire Wire, SONET, or MPU devices that will be final tested at-speed on a T6682. With a clock frequency to 1.6 GHz and data rates to 1 Gbps, the T6682 complements this performance at the high end by providing very high speed performance for testing these devices that use new interface technology, at-speed.