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To: Jim Bishop who wrote (14025)	11/11/1999 3:31:00 PM
From: Investor Clouseau	Respond to of 150070

:-)))IC:)

To: Jim Bishop who wrote (14025)	11/11/1999 4:03:00 PM
From: SSP	Respond to of 150070

LOCH - Nov. 11, 1999--Loch Harris Inc. (OTC BB:LOCH) has secured exclusive, proprietary rights to a breakthrough technology that will slash manufacturing times and advance precise measurements required in the semiconductor industry by two orders of magnitude, according to CEO Rodney Boone. "The acquisition was made with restricted stock, enabling Loch Harris to continue to operate without long-term debt," said Boone. Scientists at the Tucson, Ariz., laboratories of Chemical Detection Technology Inc. (ChemTech) are already working to marry an advanced Shack Hartmann wavefront sensor developed by SPOT Inc. of Italy to an existing nanometrology device developed by noted physicist Dr. Henry Blair. The result is expected to create a noninvasive, real-time, in situ remote sensing tool capable of accuracies to one billionth of a meter (10 to the minus 9th) without disturbing the environment being studied. "That is two orders of magnitude greater than systems now in use, an increase of 100 times," said Boone. Shack-Hartmann technology has been in use for several decades. ChemTech's newly acquired, unique Shack Hartmann device provides computer-controlled alignment and evaluation of complex optical systems such as professional research telescopes, large and small-scale laser systems, optical finishing systems and microscopes. It is currently utilized for telescope mirror alignment in operation at renowned observatories such as the Galileo in Italy, the Zeiss in Greece and the Apache Point in Arizona. This will bring great benefits to the precision manufacturing of optical mirrors used for astronomy, he acknowledged. "But it is in semiconductor manufacturing that we see the greatest benefits," he said. "Those benefits come on both ends," said Dr. Blair, "first, in the pre-process, where wafer flatness, edge condition, total thickness variation, and bow and warp must be precisely measured, and second, in the end-process, where the measurement of film and roughness are critical." Current processes require as long as 10 to 16 minutes to mechanically measure these variances. "Loch's ChemTech device will cut that process to less than 20 seconds, a savings that adds up to real money in the multi-billion dollar semiconductor industry," said Blair. "The acquisition of the advanced Shack Hartmann wave front sensor and nanometrology technologies puts ChemTech at the forefront of emerging technological development," said Blair. "Just recently, the National Institute of Standards and Technology (NIST), writing about microsystems and nanosystems technology, said that one of the major barriers to widespread applications in this is the 'absence of microsystem design, fabrication and testing.' "ChemTech has been invited to send a team to NIST's Advanced Technology Program (ATP) workshop in San Jose, Calif., on Monday. The timing is incredible, with talks with Lucent Technology set to begin next week," Boone said. "It is satisfying to see our vision for ChemTech come together so quickly with last week's reported successful live explosive tests of its new landmine detector, the ELF and the development of its plasma chamber monitoring device, the VAMMP," he said. Safe Harbor Statement under the Private Securities Litigation Reform Act of 1995: The statements which are not historical facts contained in this press release are forward-looking statements that involve certain risks and uncertainties including but not limited to risks associated with the uncertainty of future financial results, regulatory approval processes, the impact of competitive products or other uncertainties detailed in the Company's filings with the Securities and Exchange Commission. --30--bd/sa* CONTACT: Loch Harris Inc., Austin Mark Baker, 512/328-7808 lochharris.com