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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: Bill Jackson who wrote (81613)	12/1/1999 11:23:00 AM
From: Elmer	Read Replies (1) \| Respond to of 1572707

Re: "I wonder if this bug is a threshold bug that slipped out because they loosened a test spec to ship more parts? " Bill, the term "bug" is misapplied here. This is a test escape, not a bug. A bug is a flaw in the logic that affects all parts, like the fdiv bug. This looks like a process sensitivity that only affects a small number of parts at powerup. It can be screened for at test and corrected in a future stepping to avoid yield loss. Customers(oems) know in the early life of a new product the DPM (defects per million) will be higher than at maturity. A bug affects all parts, a test escape affects only a small number of parts. EP