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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: Bill Jackson who wrote (82337)	12/8/1999 9:23:00 AM
From: Elmer	Read Replies (1) \| Respond to of 1578295

Re: "Elmer, English must not be your first language. The procedure that you describe is just what I say it is." Bill the procedure is nothing like what you said. 1) There is no database. 2) There is no separate test, it is part of a single test suite. 3) It is done both on the wafer and all packaged parts. Wafers represent cold conditions as they may be chilled and packaged parts are hot. The test is intended as a reliability screen as well as a max_icc measurement. EP