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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: Elmer who wrote (86118)	1/9/2000 12:58:00 AM
From: Process Boy	Respond to of 1573954

Elmer - <Actually there is a way to predict yields based on die area where a die-A could be 2x the size of die-B and yield 1/3 the good die as die-B yet they be judged as equivalent yield. It's all based on defect density. PB can explain if he has a mind to.> Suffice it to say there is a way, i.e. defect density calculations. Your explanation is good enough, IMHO. I have a little program available to me that does the calculations by plugging in die sizes and either assumed or real defect density levels, so I don't have to sit around doing the long math. PB