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To: Elmer who wrote (126201)	1/28/2001 4:40:35 PM
From: muzosi	Respond to of 186894

there are mainly two solutions to this problem. One is manufacturers do a sampling based exhaustive test; the other is that there is BIST on most DRAMs which do similar tests in parallel on all the banks etc. The difficulty with memtest is that it doesn't know the internal structure of the memories so it has to do a lot more than necessary to cover all the different type of dram. If you have BIST and know the internal structure, it takes a lot less time. This plus sampling covers most of the errors one sees. Of course there is always error correction if your data is valuable enough. Muzo