To: Jody Ritchie who wrote (413 ) 2/15/2001 3:12:41 PM From: Perry Ganz Read Replies (1) | Respond to of 620 Nice move today +6 as I type Toshiba and Sandisk Select Agilent Technologies' Flash Memory Test World's Largest Suppliers of High-Density NAND Memory Choose Agilent Versatest Series Model V4400 NVM Test System PALO ALTO, Calif., Feb 15, 2001 (BUSINESS WIRE) -- Agilent Technologies Inc. (NYSE: A chart, msgs), a leading provider of innovative technologies for communications and life sciences, has been selected by FlashVision LLC, a joint venture between Toshiba Corporation and SanDisk Corporation, to test flash memory devices with the Agilent V4400 Non-Volatile Memory Test System at Dominion Semiconductor in Virginia, Toshiba's Japan facility, SanDisk's California facility and numerous contract manufacturers worldwide. "This is a great endorsement by Toshiba Corporation, the world's largest manufacturer of NAND Flash semiconductors, and SanDisk Corporation, the world's largest supplier of flash data and audio storage products," said Gayn Erickson, marketing manager for Agilent's Memory Test Division. "Their joint selection of the Agilent V4400 to test NAND and NOR Flash devices affirms Agilent's leadership in Flash memory test." Leading the industry in meeting the needs of Flash manufacturers, Agilent currently has the largest market share in the NOR Flash sector with more than 1,000 systems installed worldwide. More than 21 patented hardware and software features on the Agilent V4400 lower the cost of ownership for NAND, NOR and embedded Flash test systems while providing the highest performance to meet future needs. The recently introduced Versatest Series Model V4400 provides a solution to test up to 36 NOR or up to 144 NAND devices at speeds of true 100 MHz (200 MHz in MUX mode). All the pin electronics are in a compact test head using Agilent's leading-edge technology, resulting in the industry's smallest footprint -- under 28 square feet. The V4400's proven tester-per-site architecture provides a turnkey solution to test up to 300 mm wafer, not only for Flash, but also for other memory and microcontroller devices. "We selected the Agilent V4400 based on its performance, lowest cost of test, and the platform's flexibility to address our NOR/NAND devices today and into the future, including wafer sort and final test," said Sanjay Mehrotra, senior vice president of engineering, SanDisk Corporation. According to Shigeo Koguchi, vice president of Memory Division, Toshiba Flash Business, Agilent's experience in Flash testing and its understanding of Flash technology was key in selecting the V4400. About Agilent Technologies Perry