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To: pgerassi who wrote (28382)	2/14/2001 11:38:08 AM
From: AK2004	Respond to of 275872

Pete I got it, I went to school at one point long long long long time ago. :-)) forgive my naive interpretation but it sounds like simple binomial approach for uniform distribution of defects where n would be a number of transistors per die. p would be a probability of transistor being defective. I am not sure where exp decay came from (approximation for small p and large n?) but I take your word for it that it is better than my simple binomial. The original post is done by analysts and they most likely would use different estimate since those other factors would likely to be very different for pIII and p4 - just guessing here Regards -Albert