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To: THE WATSONYOUTH who wrote (40519)5/19/2001 5:19:13 PM
From: ptannerRespond to of 275872
 
TWY, Re: Emotion @ 238mm^2

You are correct that the size was from the article I linked to which was written during the days of 0.25 micron processes. I didn't look hard enough to find a more current link, but even with a process shrink it would still be much larger than the coppermine proposed for the X-Box.

-PT



To: THE WATSONYOUTH who wrote (40519)5/21/2001 1:14:01 AM
From: milo_moraiRead Replies (1) | Respond to of 275872
 
<font color=green>Industry Divides on Low-k Dielectric Choices


At a Glance

At the 0.13 µm node, device manufacturers are split among those that will use an organic spin-on dielectric (SOD); those that will use silicate films, produced by PECVD or SOD; and those that will wait until future generations to use these new films. The ability to overcome extensive integration challenges and extend a material's performance will determine a company's long-term success at attaining a low effective dielectric constant (keff). Together with copper interconnects, low-k dielectrics deliver faster device speed and reduced crosstalk in advanced devices.


Laura Peters,
Senior Editor

Full Story semiconductor.net

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