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Technology Stocks : Intel Corporation (INTC) -- Ignore unavailable to you. Want to Upgrade?

To: Robert Salasidis who wrote (148907)	11/20/2001 12:33:42 AM
From: Elmer	Read Replies (1) \| Respond to of 186894

Precisely the point. I used a discreet MOSFET to compare the difference in leakage between 25 and 120 degrees C, and the difference was 25x (IRF7401). Using a discreet Schottky diode, the difference between 50 and 100 deg C is 20x (IRF30BQ015) In the world of Test we used to think we could detect manufacturing defects causing microamps of leakage. It was called Iddq testing and it was the darling of Test a few years back. Like so many other things that come out of academia it sounded great on paper but the problem was that at final test when using high temperature, the normal leakage currents increased 100x or more so how could we screen for a few microamps? Comparing AMD at 50 dec C (below the knee) vrs Intel at 100 dec C (past the knee) is nonsense. EP