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Technology Stocks : Advanced Micro Devices - Moderated (AMD) -- Ignore unavailable to you. Want to Upgrade?

To: hmaly who wrote (75609)	3/26/2002 3:33:06 PM
From: Yousef	Read Replies (1) \| Respond to of 275872

Hmaly, Re: "From your description it would seem DD encompasses any type of killer defect ..." This is true the way I have described yield (Ysimple). It is very simplified to just think of defect density as due to particles. I have seen many design rule/process margin problems that clearly affect Ysimple and thus the calculated defect density. A good example would be high Via resistance caused by Vias falling too far off the metal interconnect. This high Via resistance can cause speed critical paths to fail and this could be worse at the edge of the wafer relative to the center. This is but just one example of how design rules interact with the process and can cause yield loss. I am not saying that AMD has a specific (high Via resistance) yield problem. Hard defects and process margins need to be continually improved to achieve "world class" defect density. Hope this helps. Make It So, Yousef