Silicon Investor (SI) -- The First Internet Community

STOCKTALK

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor. We ask that you disable ad blocking while on Silicon Investor in the best interests of our community. If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.

Technology Stocks : Applied Materials No-Politics Thread (AMAT) -- Ignore unavailable to you. Want to Upgrade?

To: Ira Player who wrote (15223)	6/9/2005 12:17:19 AM
From: etchmeister	Read Replies (1) \| Respond to of 25522

2138 Wafer Inspection System with Ultra-Broadband Technology Inline inspection systems must be able to detect all types of yield-limiting defects — whether handling, tooling, or process. Only complete visual access to all defect types ensures comprehensive yield correlation and implementation of effective yield strategies. The KLA-2138 — consistently detects the widest range of yield-relevant defect types on all process layers, at speeds required for high-volume wafer production. Based on KLA-Tencor's proven image processing technology, the 2138 features an ultra-broadband (UBB) illumination source in combination with significantly improved brightfield optics and unique Segmented Auto Threshold (SAT) technology. The result is a dramatic improvement in defect detection sensitivity — especially on wafers with extreme color variation — as well as faster setup times, improved throughput in many applications, and improved wafer alignment reliability. The 2138 is also available with an integrated SMIF minienvironment, reducing overall fab cleanliness requirements while streamlining automation. For complete information, download the product overview below. Disclaimer: Important information about used products That's what AMAT is up to - I don't see any connection to mask inspection