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To: Return to Sender who wrote (27056)11/22/2005 12:14:06 AM
From: sixty2nds  Respond to of 95633
 
17:01 KLAC KLA-Tencor announces new collaboration with Spansion

Co announced that a collaboration with Spansion's Fab 25 in Austin, Texas, has opened up a new application for its MicroLoop electrical defect detection methodology that enabled Spansion to detect critical bridging defects on advanced flash memory product wafers in production nearly twice as fast as previous methods. This effort leveraged the use of KLA-Tencor's eS31 electron-beam inspection system in conjunction with its proprietary MicroLoop methodology. As a result, Spansion has deployed the eS31 and MicroLoop to assist in the production of its 90-nm MirrorBit technology and its 110-nm NOR flash technology.