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Technology Stocks : Semi Equipment Analysis -- Ignore unavailable to you. Want to Upgrade?

To: sixty2nds who wrote (28815)	2/23/2006 4:28:36 PM
From: michael97123	Read Replies (1) \| Respond to of 95683

anybody see news on txn today?

To: sixty2nds who wrote (28815)	2/24/2006 2:14:43 AM
From: etchmeister	Read Replies (1) \| Respond to of 95683

Because it's highly unlikely they know KLAC's margin structure; (KLAC)Products We market and sell products to virtually all major semiconductor, wafer, photomask and data storage manufacturers worldwide. We combine our hardware-consisting of patterned and unpatterned wafer inspection, optical overlay metrology, e-beam review, reticle and photomask inspection, spectroscopic- and e-beam-based CD metrology, and film and surface measurement tools-with our advanced yield analysis and defect classification software to provide fab-wide yield management solutions that are optimized for the manufacturing process cells used in IC production, including lithography, etch, deposition and chemical mechanical planarization ("CMP"). Our offerings can be broadly categorized into five groups: Defect Inspection, Metrology, Yield Management Software Solutions, Data Storage, and Customer Service and Support. ADE WaferSight System Targets 35nm Processes at Leading Wafer Polishing Manufacturer... Wed Oct 26, 2005 10:00 AM ET ADE WaferSight System Targets 35nm Processes at Leading Wafer Polishing Manufacturer Peter Wolters; High-Precision Wafer Mapping and Edge Roll-off Analysis Allows Peter Wolters to Quickly Improve Tool Performance WESTWOOD, Mass.--(Business Wire)--Oct. 26, 2005-- ADE Corporation (Nasdaq: ADEX) today announced that the leading expert in wafer polishing, Peter Wolters AG, has purchased and installed a WaferSight(TM) advanced wafer geometry system at its R&D laboratory in Germany. WaferSight provides high resolution mapping of wafer shape, flatness, thickness and edge roll-off variations based on ADE's proprietary optical laser interferometry. The sub-nanometer site flatness measurement precision offers better control of the polishing process, and supports the ITRS roadmap requirements at and beyond the 35nm technology node. "The high precision surface mapping capabilities of the WaferSight, with integrated edge roll-off analysis, have allowed us to extend the results of our advanced polishing systems," stated Peter Wolters R&D Director Dr. Georg Moersch. "WaferSight helps us to have a better eye on tool performance for double-sided polishing, our AC line, and is even more important for the haze-free polishing feature of our newly developed HFP300 system. Within a short period of time, we have been able to identify and correct several process-specific signatures thereby further improving polished wafer quality. WaferSight is a valuable tool as we develop our equipment and processes for the 35nm technology node in order to maintain our leading position in this highly competitive market." ADE's WaferSight offers low cost of ownership dimensional metrology for wafer suppliers, incoming quality control and semiconductor equipment manufacturers' R&D applications. In addition to industry standard wafer thickness, flatness, bow and warp measurements, the WaferSight system simultaneously measures and reports wafer edge roll-off (ERO), a critical component of lithography yield and CMP uniformity and process control. Production-proven WaferSight systems are available for both 300mm and advanced 200mm applications with non-contaminating edge-grip wafer handling. About Peter Wolters AG Peter Wolters AG, the dominant worldwide supplier of double side and haze free silicon wafer polishing equipment, is a wholly owned subsidiary of Novellus. To learn more about Peter Wolters, visit the company's web site at peter-wolters.com.