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Technology Stocks : Advanced Micro Devices - Moderated (AMD) -- Ignore unavailable to you. Want to Upgrade?

To: Reseller Mike who wrote (202331)	6/15/2006 1:37:05 PM
From: eracer	Respond to of 275872

Re: Are you confusing yield with number of available die per wafer? Yield is a function of defect. The larger die size does introduce a small increase in potential defect area but the size of the cache is pretty immune from the yield because all modern cache designs have redundancy built in to get around potentially bad die areas. No, what I was stating is that yields become more important as the available dies per wafer decreases, especially when capacity is already a concern. Rev. F is probably more susceptible to yield issues than rev. E as well because any defect is more likely to be in a non-cache area with the larger non-cache core and slightly more dense L2 cache.