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To: combjelly who wrote (207535)8/4/2006 12:31:14 AM
From: Elmer PhudRespond to of 275872
 
He is talking in the classical sense. In that case, defect density was the determining factor. But those were the days when design features were larger than the wavelength of light used to produce them and patterned features tended to be rectangles...

Too bad you've never seen how well a top notch fab runs. You might learn something...



To: combjelly who wrote (207535)8/4/2006 12:35:51 PM
From: TGPTNDRRespond to of 275872
 
CJ, Re: Here is a paper on why ramps can be slowed with smaller features.>

A good read. Thanks.

eetimes.com

A curiosity question. ephud said I haven't spent 25 years developing test capability for 100s and 100s of millions of parts ...

Message 22686222

Seems to me I remember elmer talking about 25 years back before the turn of the century. Anybody else have such a memory?

Could be why he remains so fixated on particle defects.

-tgp


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