SI
SI
discoversearch

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor.  We ask that you disable ad blocking while on Silicon Investor in the best interests of our community.  If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.
Technology Stocks : Advanced Micro Devices - Moderated (AMD) -- Ignore unavailable to you. Want to Upgrade?

To: TGPTNDR who wrote (229055)3/27/2007 6:34:19 PM
From: dougSF30Respond to of 275872
 
INTC got the high bins but not many parts.

This is fantasy.

confusing bin splits for yield

There is decent correlation there, once you factor out the unchanging defect-density related to die-size.



To: TGPTNDR who wrote (229055)3/27/2007 7:10:57 PM
From: combjellyRead Replies (2) | Respond to of 275872
 
"IMO you are once again, as lots of folks have in the past, confusing bin splits for yield. "

In addition, yield is no longer strictly a defect density issue. As the paper that neolib posted and I presume the Intel paper that Sarmad posted about.


HomeMailHotSubjectMarksPeopleMarksKeepersSettings
Terms Of UseContact UsCopyright/IP PolicyPrivacy PolicyAbout UsFAQAdvertise on SI
© 2025 Knight Sac Media.  Data provided by Twelve Data, Alpha Vantage, and CityFALCON News