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To: Windsock who wrote (237476)7/27/2007 5:22:15 PM
From: Reseller MikeRespond to of 275872
 
Wakey, Wakey... (snort, snort)

Just because someone develops testing methodology and/or
oversees that testing does not imply they are involved in
the further analysis of that data for yield. I seem to recall
he mentioned functional testing, stuck at fault testing and
speed path testing.

I know the output from tested known good die are the input
for the yield measurement. He may know those numbers (and he
has implied that he does) but it may only be ancillary.

He has stated that he has access to fab data and probably
does know the yield numbers.