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To: Elmer who wrote (40486)11/17/1997 1:11:00 AM
From: Paul Engel  Read Replies (1) | Respond to of 186894
 
Elmer - Re: "no speed grading can be reliably done at the wafer level."

Thanks for pointing this out.

Paul



To: Elmer who wrote (40486)11/17/1997 10:01:00 AM
From: Time Traveler  Read Replies (1) | Respond to of 186894
 
Elmer,

Can you detect/test whether a die is good or bad (meeting the spec, etc) on the wafer level? Or die level? Or packaged?

John.