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Politics : Formerly About Applied Materials -- Ignore unavailable to you. Want to Upgrade?


To: andy kelly who wrote (15377)2/3/1998 8:28:00 PM
From: Big Bucks  Read Replies (1) | Respond to of 70976
 
Andy,
Major coup, allows fab to check each wafer as opposed to sample
wafers every shift, will allow rapid identification and isolation of
systems/chambers that are causing contamination/particles on
wafers. This sometimes ruins hundreds of product wafers, this new
technology will virtually eliminate the unknowns and enhance
productivity. Will make lots of money for AMAT!

Regards, BB