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To: VinWood who wrote (51933)4/2/1998 5:21:00 PM
From: Tony Viola  Read Replies (1) | Respond to of 186894
 
Vin, Re: "The statement is absolutely true. In my experience, it is usually found that on a low-yielding
wafer, those dice that yield are usually borderline acceptable, prone to early failure."

Thanks for your input. One other thing I found out about recently is that IBM has a thing they call "Maverick wafers". If, as they are stepping across the wafer in wafer probe test, they see (by automation equipment, of course) that the wafer is yielding low, below a threshold percentage, THEY THROW THE WHOLE WAFER OUT, GOOD DIE AS WELL AS BAD.

Whoever is accusing me of spreading FUD (I forget), go ahead and include IBM process news in there as part of it.

Tony