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To: John Donahoe who wrote (51999)4/3/1998 1:31:00 PM
From: Paul Engel  Read Replies (1) | Respond to of 186894
 
John - Re: "Or is it performed on "packaged" operational (ie.
clocked) CPUs?"

Burn-In is generally performed on packaged/assembled/tested devices. For new processes - or processes in deep trouble - it is done 100% for all devices. Standard procedures are to run the devices in a basic operational mode, running simple test vectors through the device.

A slightly modified version - Life-Test - is also perfromed at elevated temperatures for extended periods of time 1,000 hours up to maybe 5,000 hours. Like Burn-In, this is generally done running the devices in an operational mode.

Sophisticated LifeTest/Burn-in systems can perform real time functionality tests (of a limited nature) to provide "real time" failure rates.

Life Test results can provide enormously valuable data regarding the ultimate long term reliabilty of products and processes - and uncover latent failure modes if present.

Intel's Smart Die program does allow for burn-in of unpackaged devices - i.e., bare die. This is an expensive, delicate process requirng special connectors/sockets and delicate handling operations.

Paul