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Politics : Formerly About Applied Materials -- Ignore unavailable to you. Want to Upgrade?


To: Teri Skogerboe who wrote (19199)5/8/1998 12:47:00 PM
From: Gottfried  Respond to of 70976
 
Teri, Applied is honing the sword...

Friday May 8, 7:04 am Eastern Time

Company Press Release
Applied Materials Unveils Industry's First Fully-Automated Defect
Review SEM for High-Volume Production

[snip]
''The SEMVision interfaces with a broad range of
available patterned wafer inspection systems and
particularly complements our recently introduced
WF-73X-series systems. Together they provide an
integrated high-speed defect detection and review
capability that will enable our customers to improve and
maintain device yield throughout the fab.
[snip]

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