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Politics : Formerly About Advanced Micro Devices -- Ignore unavailable to you. Want to Upgrade?

To: FJB who wrote (33492)	6/22/1998 2:15:00 AM
From: Yousef	Read Replies (1) \| Respond to of 1573092

Bob, Re: "Could you clarify some terminology for me?" I will tell you my terminology ... Most Fab parameters have an upper spec, lower spec and nominal (usually center of spec ... but not always). The nominal is the target for the average of the distribution. So nominal gate CD is the average printed poly CD in this terminology, while the fast case refers to the high drive current case which is the lower spec of the printed poly CD's. Leff is the electrical poly length that is calculated/extracted from the electrical FET test data. Leff is typically .05um - .08um smaller than the printed gate poly CD. Example: Lower Spec - .18um ... rework wafers with narrower CD's Nominal - .20um Upper Spec - .22um .... rework wafers with wider CD's Fast Case = Lower Spec = .18um Leff = (Nominal - .08um) = .12um Make It So, Yousef