Silicon Investor (SI) -- The First Internet Community

STOCKTALK

We've detected that you're using an ad content blocking browser plug-in or feature. Ads provide a critical source of revenue to the continued operation of Silicon Investor. We ask that you disable ad blocking while on Silicon Investor in the best interests of our community. If you are not using an ad blocker but are still receiving this message, make sure your browser's tracking protection is set to the 'standard' level.

Politics : Formerly About Applied Materials -- Ignore unavailable to you. Want to Upgrade?

To: BelowTheCrowd who wrote (25144)	10/9/1998 7:52:00 PM
From: Jeff Fox	Respond to of 70976

Michael, re: K6-2 flaw Thanks for the info, but this is not inconsistent with my post. Device race conditions are always temperature sensitive as temperature alters transistor drive strengths. The time delay difference between competing set and reset signals is altered with temperature, often allowing to aberrant state to occur more frequently. You state that it is a process flaw. Do you have information as to the nature of the flaw? I freely admit that I am guessing in a vacuum of information. There are a myriad of possibilities. Could be anything, it is just that bad circuits are at the root of most intermittent type problems. Jeff