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Politics : Formerly About Applied Materials -- Ignore unavailable to you. Want to Upgrade?


To: Math Junkie who wrote (25710)10/23/1998 6:40:00 PM
From: Katherine Derbyshire  Read Replies (1) | Respond to of 70976
 
Sorry, I meant removing the wafer from the process chamber. Fingers got ahead of brain.

Overall, I think we agree about defect detection vs process control applications. Checking a few spots on a few wafers with an inspection tool is a very different application from looking at 100% of wafers with an in situ tool or sensor.

Katherine